| Commit message (Collapse) | Author | Age | Files | Lines |
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{longIs32bit wideIs64bit}. And ... it's name is actually wrong ...
Don't use int() any more in any test constraint, since it's semantics might change. We don't want the test constraints to change with it. (See: TIP# 514)
Simplify implementation of wideIs64bit test constraint, just testing for 64-bit sign bit is enough.
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function.
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format octal numbers: it isn't. Better use "%#o".
Add tests for "format" and "scan" corner-cases which weren't documented (except in TIP's) neither had tests before.
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doesn't work. Also added new test-cases showing the expected behavior.
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string, by allowing uppercase %X, %E and %G.
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string, by allowing uppercase %X, %E and %G.
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Also updated scan.test to use tcltest 2 properly.
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[scan Inf %g] is portable; remove constraint.
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[scan Inf %g] is portable; remove constraint.
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cause more harm than good. Purged them (except in zlib files).
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more harm than good. Purged them.
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more harm than good. Purged them.
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1011860]
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* doc/scan.n:
* generic/tclScan.c: [scan $s %u] is documented to accept only
* tests/scan.test: decimal formatted integers. Fixed code to
match.
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Consistent method of calling test constraints, and (try to) move constraint
setup to the top of the test file
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* generic/tclCmdMZ.c: Modified [string is double] to use
* tests/string.test: TclParseNumber() to parse trailing whitespace.
Ensures consistency, and makes it easier to cleanup after invalid
internal reps left behind by parsing [Bugs 1360432 1382287].
* generic/tclParseExpr.c: Added TCL_PARSE_NO_WHITESPACE to
* generic/tclScan.c: TclParseNumber() calls since [scan] and
* tests/scan.test: [expr] parsing don't want spaces in parsed
numbers.
* generic/tclInt.h: Added TCL_PARSE_NO_WHITESPACE flag to the
* generic/tclStrToD.c: TclParseNumber() interface.
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[kennykb-numerics-branch] Resynchronized with the HEAD; at this
checkpoint [-rkennykb-numerics-branch-20051008], the HEAD and
kennykb-numerics-branch contain identical code.
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* tests/error.test: tests into tests with constraints that
* tests/expr-old.test: describe the limits of their
* tests/expr.test: portability. Also more consolidation
* tests/fileName.test: of constraint synonyms.
* tests/format.test: wideis64bit, 64bitInts => wideIs64bit
* tests/get.test: wideIntegerUnparsed => wideIs32bit
* tests/load.test: wideIntExpressions => wideBiggerThanInt
* tests/obj.test:
* tests/parseExpr.test: Dropped "roundOffBug" constraint that
* tests/string.test: protected from buggy sprintf.
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1011860]
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with options -constraints knownBug -limitConstraints 1 only tests
the knownBug tests. Mostly involves replacing direct access to the
testConstraints array with calls to the testConstraint command
(which requires tcltest version 2).
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This version builds clean on Solaris/SPARC, with GCC and CC, both with and
without threads and both in 32-bit and 64-bit mode.
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* generic/tclScan.c (Tcl_ScanObjCmd): corrected scan 0x... %x
handling that didn't accept the 0x as a prelude to a base 16
number. [Bug #495213]
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* tests/scan.test:
* generic/tclScan.c (Tcl_ScanObjCmd): changed %o and %x to use
strtoul instead of strtol to correctly preserve scan<>format
conversion of large integers. [Patch #102663, Bug #124600]
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::tcltest" to "namespace import -force ::tcltest" [Bug: 3948].
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* generic/tclScan.c: fixed scan where %[..] didn't match anything
and added test case [Bug: 3700]
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* generic/tclScan.c: finished support for inline scan by
supporting XPG identifiers.
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Fixed bug in pkg.test where defs.tcl was still being used.
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